Randomized Benchmarking and Process Tomography for Gate Errors in a Solid-State Qubit

Publication Year
2009

Type

Journal Article
Journal
Phys. Rev. Lett.
Volume
102
Pages
090502
Date Published
03/2009

We present measurements of single-qubit gate errors for a superconducting qubit. Results from quantum process tomography and randomized benchmarking are compared with gate errors obtained from a double π pulse experiment. Randomized benchmarking reveals a minimum average gate error of 1.1±0.3% and a simple exponential dependence of fidelity on the number of gates. It shows that the limits on gate fidelity are primarily imposed by qubit decoherence, in agreement with theory.